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Seminar paper
Entry Year2005
Paper type口頭報告 / 會議論文
Paper levelSCI / SSCI
Paper title (chapter)A multilevel sensing and program verifying scheme for Bi-NAND flash memories
Name of conference2005 IEEE VLSI-TSA International Symposium
Conference starting time2005-04-27
Conference closing time2005-04-29
Year of publication2005
Name of author (Chinese)Chiu-Chiao Chung
Name of author (English)Chiu-Chiao Chung
AuthorsChiu-Chiao Chung, Hongchin Lin, You-Min Shen, Yen-Tai Lin
Number of authors4
Author's typeFirst Author
LocationHsin Chu ,R.O.C.
sponsorVLSI Design, Automation and Test
Language usedEnglish
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